Topic “Electronic Circuit Card Testing in Industry” Presenter: Sol Black
DATE: Tuesday, 17 FEB 2015 Time: Refreshments: 5:30 Meeting: 6:00 to 7:00 PM
Location: DeVry University Room 160 1350 Alum Creek Drive, Columbus, OH 43209-2705
Abstract: In this one hour presentation, Mr. Sol Black, explains the various techniques to test electronic circuit cards in a manufacturing environment. He covers disciplines such as Product-Testing-Product, Functional Testing, and Boundary Scan (JTAG IEEE 1149.X), but concentrates on In Circuit Testing as this is the fastest way to test products as well as the method having the highest fault coverage.
This is a fast moving and entertaining discussion which combines humor with a lot of technology. It is not an academic speech but a real hands-on description of what is done in the industry. Although students will find this talk especially informative, practicing Engineers will also learn a considerable amount from it.
Biography: Mr. Black is a Senior Member of IEEE and a retired Senior Test Engineer from Western Electric/AT&T/Lucent Technologies. He was responsible for Design For Testability and Test Development at Lucent. He has also consulted in the field, spent time at Celestica Technologies, and is still working in the field, part-time, at LSI/ADL Technologies. He resides in a suburb of Columbus, Ohio. He is the Membership Chair of the IEEE Columbus Section and past Chair, Vice Chair, and Secretary. He also served many years as the Communications Society Chair of the Columbus Section.
Please RSVP to Robert A. Walston by email to Robert.Walston@gmail.com Or by phone at 740-334-1110 by 1 PM on Monday, 16 February 2015.